I am involved in a project that requires the simulation of THG from silicon under different doping and crystalline orientations. I have several questions regarding the possibility of using Lightwave Explorer for the simulation section.
Can this software simulate the THG reflected back from the surface, or is this only allowing transmission type? Because the experiment system I intend to build is a reflected type microscope @ 1550 nm, 80 mW. Below is my intended system configuration.
Can we add multiple stacks of materials? Let's say Si-Ge deposited on Si subtract? It would be nice if you could share some example simulations with us because I tried here and there in your software but could not find them.
This is the paper I want to replica the result using your software (just for reference) : "Yi Gao, Hyub Lee, Jiannan Jiao, Byung Jae Chun, Seungchul Kim, Dong-Hwan Kim, and Young-Jin Kim, "Surface third and fifth harmonic generation at crystalline Si for non-invasive inspection of Si wafer's inter-layer defects," Opt. Express 26, 32812-32823 (2018)," Especially about the result like Figure 2e and Figure 3
Dear Dr. Nick,
I am involved in a project that requires the simulation of THG from silicon under different doping and crystalline orientations. I have several questions regarding the possibility of using Lightwave Explorer for the simulation section.
Can this software simulate the THG reflected back from the surface, or is this only allowing transmission type? Because the experiment system I intend to build is a reflected type microscope @ 1550 nm, 80 mW. Below is my intended system configuration.
Can we add multiple stacks of materials? Let's say Si-Ge deposited on Si subtract? It would be nice if you could share some example simulations with us because I tried here and there in your software but could not find them.
This is the paper I want to replica the result using your software (just for reference) : "Yi Gao, Hyub Lee, Jiannan Jiao, Byung Jae Chun, Seungchul Kim, Dong-Hwan Kim, and Young-Jin Kim, "Surface third and fifth harmonic generation at crystalline Si for non-invasive inspection of Si wafer's inter-layer defects," Opt. Express 26, 32812-32823 (2018)," Especially about the result like Figure 2e and Figure 3
Best Regard, Chu.