binyisu / PVEL-AD

Photovoltaic cell defect detection
Apache License 2.0
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dataset el2021 object-detection pvelad

Solar cell EL image defect detection dataset

News

[2023-12-19]:2周内回复!Reply within 2 weeks! I am busy with my graduation thesis, please understand!

[2023-03-06]:所有人须知: 我们没有提供测试标注,测试你的算法请到 https://www.kaggle.com/competitions/pvelad

[2023-03-06]:Notice to all: We do not provide test annotations, please go to the following URL for testing your algorithms https://www.kaggle.com/competitions/pvelad

[2022-04-13]:Box annotations for vertical_dislocation and horizontal_dislocation will be added into PVELAD dataset.

[2021-12-14]: Training data augmentation via horizontal_flipping.py. Evaluation: first, converting ground truth xml to txt by get_gt_txt.py; Second, appling AP50-5-95.py to evaluate the detection results.

[2021-11-23]: A kaggle competition platform is built, then you can submit you result in https://www.kaggle.com/c/pvelad, and evaluate your algorithm.

Dataset application website: http://aihebut.com/col.jsp?id=118 or https://github.com/binyisu/PVEL-AD

2021 Dataset Access Instructions:

We build a Photovoltaic Electroluminescence Anomaly Detection dataset (PVEL-AD ) for solar cells, which contains 36,543 near-infrared images with various internal defects and heterogeneous backgrounds. This dataset contains 1 class of anomaly-free images and anomalous images with 12 different categories such as crack (line and star), finger interruption, black core, thick line, scratch, fragment, corner, printing_error, horizontal_dislocation, vertical_dislocation, and short_circuit defects. Moreover, 40358 ground truth bounding boxes are provided for 12 types of defects. This is a long-tail object detection task, which is challenging and significant for smart manufacturing.

Category (12 classes) trainval test
finger 2958 22638
crack 1260 2797
black_core 1028 3877
thick_line 981 1585
horizontal_dislocation 798 1582
short_circuit 492 1215
vertical_dislocation 137 271
star_crack 135 83
printing_error 32 48
corner 9 12
fragment 7 5
scratch 5 3

The PVELAD-2021 Datasets Request Form is available here.

All researchers need to follow the instructions below to access the datasets.

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[1] Binyi Su, Zhong Zhou, Haiyong Chen, “PVEL-AD: A Large-Scale Open-World Dataset for Photovoltaic Cell Anomaly Detection,” IEEE Trans. Ind. Inform., DOI (identifier) :10.1109/TII.2022.3162846

[2] B. Su, H. Chen, Y. Zhu, W. Liu and K. Liu, ``Classification of Manufacturing Defects in Multicrystalline Solar Cells With Novel Feature Descriptor,'' IEEE Trans. Instrum. Meas., vol. 68, no. 12, pp. 4675--4688, Dec. 2019.

[3] B. Su, H. Chen, and P. Chen, ``Deep Learning-Based Solar-Cell Manufacturing Defect Detection With Complementary Attention Network,'' IEEE Trans. Ind. Inform., vol. 17, no. 6, pp. 4084--4095, Jun. 2021.

[4] B. Su, H. Chen, and Z. Zhou, ``BAF-Detector: An Efficient CNN-Based Detector for Photovoltaic Cell Defect Detection,'' IEEE Trans. Ind. Electron., vol. 69, no. 3, pp. 3161-3171, Mar. 2022.