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AFM-SPM / TopoStats

An AFM image analysis program to batch process data and obtain statistics from images
https://afm-spm.github.io/TopoStats/
GNU Lesser General Public License v3.0
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Improved binary masking to retain details from grains #652

Open llwiggins opened 1 year ago

llwiggins commented 1 year ago

Current binary masking in TopoStats causes loss of fine details from the original grain (such as holes or merging of close strands) and this causes downstream issues for detection of nodes/branches.

Improved binary masking involves ridge detection filters to enhance grain boundaries ahead of masking, example below:

Original image:

image

Grain mask:

image

Binary mask following ridge detection:

image

Often ridge detection followed by binary masking causes unwanted gaps within grain masks, currently working on a solution for this.

MaxGamill-Sheffield commented 6 months ago

Can this be closed with the addition / creation of a pull-request with @SylviaWhittle's UNet code?