2 features added: PWM separation and concurrent testing
PWM separation
Some MCUs do not have the ability to have rising and falling edge PWM triggers. We separated the PWM test into 3 separate tests:
Rising triggers
Falling triggers
Rising and falling triggers
Test results now report when a specific trigger fails
Concurrent tests
Tests were designed to test specific implementations of mbed OS APIs. We added 3 additional tests to verify that crossover between APIs does not interfere. We test the following tests concurrently:
Communication APIs: Mixes SPI and I2C devices
GPI APIs: Mixes analog in/out, interrupt in, and digital in/out
Features:
2 features added: PWM separation and concurrent testing
PWM separation
Some MCUs do not have the ability to have rising and falling edge PWM triggers. We separated the PWM test into 3 separate tests:
Concurrent tests
Tests were designed to test specific implementations of mbed OS APIs. We added 3 additional tests to verify that crossover between APIs does not interfere. We test the following tests concurrently:
Feature requests
Feature requests originally brought up here: