Closed Coloquinte closed 6 months ago
There are two similar metrics here : FLL from "Fault Analysis-Based Logic Encryption" and KIP from "Hardware Trust: Design Solutions for Logic Locking". Both should have similar behaviour, but the first relies on the number of errors while the second uses output value probabilities.
It would be nice to implement the metrics used by "Fault Analysis-based Logic Encryption".
Theu use the number of test patterns that have an impact (NoP), times the total number of error (NoO), separated between 0 and 1 fault. This does not really make sense as it creates a quadratic version of the corruption (NoO only), but would be nice to have to compare to.