It might be a good idea to implement some sort of wear-leveling scheme to keep the EEPROM from dying early. It was suggested to me that some sort of round-robin scheme would do.
id ranges from 0-12 with 0 being the startup mode (data part ignored). On startup, scan the eeprom for chunks with correct checksum and highest generation number.
When writing, increment the generation number and write after the last valid chunk and start from the beginning when reaching the end.
It might be a good idea to implement some sort of wear-leveling scheme to keep the EEPROM from dying early. It was suggested to me that some sort of round-robin scheme would do.
Doodles...
id ranges from 0-12 with 0 being the startup mode (data part ignored). On startup, scan the eeprom for chunks with correct checksum and highest generation number.
When writing, increment the generation number and write after the last valid chunk and start from the beginning when reaching the end.