Is your feature request related to a problem? Please describe.
Currently running tests locally is quite slow. A large part of this problem is because we spin up a new d3d device for every test, and then destroy every d3d object on test clean up.
Describe the solution you'd like
I would instead like to have the ability to have a single device per test suite, and just run all tests as back to back commands on the command queue. This should be much quicker than the way we are doing it now.
Is your feature request related to a problem? Please describe. Currently running tests locally is quite slow. A large part of this problem is because we spin up a new d3d device for every test, and then destroy every d3d object on test clean up.
Describe the solution you'd like I would instead like to have the ability to have a single device per test suite, and just run all tests as back to back commands on the command queue. This should be much quicker than the way we are doing it now.