The 4DN + BINA Tiered System of Microscopy Metadata Guidelines was developed by the 4DN Imaging Standards Working Group in collaboration with the BINA Data Management and Quality Control Working Group (https://www.bioimagingna.org/qc-dm-wg) for documenting microscopy experiments and assessing the quality of image data.
Propose any new metadata extension, domain, category, structure, elements, or fields/values, you would like to have added to the model.
Please complete the form below and enter an issue title above following the pattern:
Ogg -- Add coverslip thickness field to Objective
Justification for the addition (brief and compelling):
Modern objectives normally are infinity corrected as well as being corrected for a certain coverslip thickness. This is indicated on the lens after the NA as an infinity symbol followed by a "/" and then characters indicating coverslip thickness correction. Usually (for me) this is 0.17 mm or 170 micrometers. But objectives exist without coverslip correction (indicated with a "-") or with a variable coverslip correction. This last case is taken into account already with the "CorrectionCollar and CorrectionCollarType fields.
Full description of the proposed addition (enough detail to implement):
Propose a new field for an objective "coverslipThickness" or similar.
- New Extension/Domain/Category name(s) (optional): __
- New Element/Field name(s): CoverslipThickness
New Element/Field description: This field describes the coverslip thickness assumed to be in the light path by the lens designers.
New Element/Field Tier: 1
New Element cardinality (e.g., 0 to many): __
New Element extension (e.g., Basic, Advanced and Confocal, etc. or new one): __
New Element domain (e.g., MicroscopeHardwareSpecifications, ImageAcquisitionSettings, etc. or new one): Instrument -> Objective
New Element category (e.g., MicroscopyEssentials, Magnification, etc. or new one): __
New Field data type: _ there are probably few enough values so that this could be type enum
New Field requirement level: __
New Field enumeration value(s): __ "0.17", "-", "1.0", "2.0", "0-2", 0-1.5", "1.2-1.8", "0-0.17", "0.15-0.19", "0.13-0.21", "Other"
Propose any new metadata extension, domain, category, structure, elements, or fields/values, you would like to have added to the model. Please complete the form below and enter an issue title above following the pattern:
Ogg -- Add coverslip thickness field to Objective
Justification for the addition (brief and compelling): Modern objectives normally are infinity corrected as well as being corrected for a certain coverslip thickness. This is indicated on the lens after the NA as an infinity symbol followed by a "/" and then characters indicating coverslip thickness correction. Usually (for me) this is 0.17 mm or 170 micrometers. But objectives exist without coverslip correction (indicated with a "-") or with a variable coverslip correction. This last case is taken into account already with the "CorrectionCollar and CorrectionCollarType fields.
Full description of the proposed addition (enough detail to implement): Propose a new field for an objective "coverslipThickness" or similar.
- New Extension/Domain/Category name(s) (optional): __
- New Element/Field name(s): CoverslipThickness
New Element/Field description: This field describes the coverslip thickness assumed to be in the light path by the lens designers.
New Element/Field Tier: 1
New Element cardinality (e.g., 0 to many): __
New Element extension (e.g., Basic, Advanced and Confocal, etc. or new one): __
New Element domain (e.g., MicroscopeHardwareSpecifications, ImageAcquisitionSettings, etc. or new one): Instrument -> Objective
New Element category (e.g., MicroscopyEssentials, Magnification, etc. or new one): __
New Field data type: _ there are probably few enough values so that this could be type enum
New Field requirement level: __
New Field enumeration value(s): __ "0.17", "-", "1.0", "2.0", "0-2", 0-1.5", "1.2-1.8", "0-0.17", "0.15-0.19", "0.13-0.21", "Other"