This is a result of having retries in the drivers/wrappers, and a desire for them to be faster (more interrupt like). We are therefore removing unnecessary delays while waiting to retry one sensor multiple times, and instead retrying the entire suite of sensors up to three times before failing that periodic reading event.
I was trying to add another driver with a long retry time, and this work was the result instead. See #564
This is unfinished, as currently it will evaluate all sensors again, instead only failing ones need be retried.
There will be a follow up PR to remove any unnecessary retries during I2C sensor data reads once this is merged.
tyeth
commented
3 months ago
This is a result of having retries in the drivers/wrappers, and a desire for them to be faster (more interrupt like). We are therefore removing unnecessary delays while waiting to retry one sensor multiple times, and instead retrying the entire suite of sensors up to three times before failing that periodic reading event.
I was trying to add another driver with a long retry time, and this work was the result instead. See #564
This is unfinished, as currently it will evaluate all sensors again, instead only failing ones need be retried.There will be a follow up PR to remove any unnecessary retries during I2C sensor data reads once this is merged.