Open Suvodeep90 opened 3 years ago
5 -> Maybe add a new RQ showing what percentage of bugs can only be captured by either process or product metrics.
@inproceedings{calikli2009effect, title={The effect of granularity level on software defect prediction}, author={Calikli, Gul and Tosun, Ayse and Bener, Ayse and Celik, Melih}, booktitle={2009 24th International Symposium on Computer and Information Sciences}, pages={531--536}, year={2009}, organization={IEEE} }
@inproceedings{yang2015deep, title={Deep learning for just-in-time defect prediction}, author={Yang, Xinli and Lo, David and Xia, Xin and Zhang, Yun and Sun, Jianling}, booktitle={2015 IEEE International Conference on Software Quality, Reliability and Security}, pages={17--26}, year={2015}, organization={IEEE} }
@article{chen2019deepcpdp, title={Deepcpdp: Deep learning based cross-project defect prediction}, author={Chen, Deyu and Chen, Xiang and Li, Hao and Xie, Junfeng and Mu, Yanzhou}, journal={IEEE Access}, volume={7}, pages={184832--184848}, year={2019}, publisher={IEEE} }
Directly uses the codes to extract features, thus it is not very useful to compare against process vs product debate.
@inproceedings{hoang2019deepjit, title={DeepJIT: an end-to-end deep learning framework for just-in-time defect prediction}, author={Hoang, Thong and Dam, Hoa Khanh and Kamei, Yasutaka and Lo, David and Ubayashi, Naoyasu}, booktitle={2019 IEEE/ACM 16th International Conference on Mining Software Repositories (MSR)}, pages={34--45}, year={2019}, organization={IEEE} }
@article{qiao2020deep, title={Deep learning based software defect prediction}, author={Qiao, Lei and Li, Xuesong and Umer, Qasim and Guo, Ping}, journal={Neurocomputing}, volume={385}, pages={100--110}, year={2020}, publisher={Elsevier} }
@article{radjenovic2013software, title={Software fault prediction metrics: A systematic literature review}, author={Radjenovi{\'c}, Danijel and Heri{\v{c}}ko, Marjan and Torkar, Richard and {\v{Z}}ivkovi{\v{c}}, Ale{\v{s}}}, journal={Information and software technology}, volume={55}, number={8}, pages={1397--1418}, year={2013}, publisher={Elsevier} }
@article{pascarella2020performance, title={On the performance of method-level bug prediction: A negative result}, author={Pascarella, Luca and Palomba, Fabio and Bacchelli, Alberto}, journal={Journal of Systems and Software}, volume={161}, pages={110493}, year={2020}, publisher={Elsevier} }
@article{li2018progress, title={Progress on approaches to software defect prediction}, author={Li, Zhiqiang and Jing, Xiao-Yuan and Zhu, Xiaoke}, journal={IET Software}, volume={12}, number={3}, pages={161--175}, year={2018}, publisher={IET} }
@inproceedings{bird2009promises, title={The promises and perils of mining git}, author={Bird, Christian and Rigby, Peter C and Barr, Earl T and Hamilton, David J and German, Daniel M and Devanbu, Prem}, booktitle={2009 6th IEEE International Working Conference on Mining Software Repositories}, pages={1--10}, year={2009}, organization={IEEE} }
@article{zhang2017machine, title={From machine learning to deep learning: progress in machine intelligence for rational drug discovery}, author={Zhang, Lu and Tan, Jianjun and Han, Dan and Zhu, Hao}, journal={Drug discovery today}, volume={22}, number={11}, pages={1680--1685}, year={2017}, publisher={Elsevier} }
@article{wang2018fast, title={A fast and robust convolutional neural network-based defect detection model in product quality control}, author={Wang, Tian and Chen, Yang and Qiao, Meina and Snoussi, Hichem}, journal={The International Journal of Advanced Manufacturing Technology}, volume={94}, number={9-12}, pages={3465--3471}, year={2018}, publisher={Springer} }