a new config layout with global options under options: and dataflow problems specifications under taint-tracking-problems: or slicing-problems:. The user can now specify several separate taint or slicing problems in the same configuration file. All problems within a category be solved with the same dataflow graph, reducing the need to re-build information for different problem. A possible improvement is to merge taint and backtrace tools in the same dataflow tool.
a new config input format: the user can now specify a config using a drawio diagram. The tool has basic functionality to extract taint-tracking problems from it. More dataflow problems can be extracted in the future.
renaming a few options of the config for readability.
This PR introduces:
options:and dataflow problems specifications undertaint-tracking-problems:orslicing-problems:. The user can now specify several separate taint or slicing problems in the same configuration file. All problems within a category be solved with the same dataflow graph, reducing the need to re-build information for different problem. A possible improvement is to mergetaintandbacktracetools in the samedataflowtool.