The new OH firmware (3.2.6) adds a full-granularity binary Sbit accumulator. Said otherwise, if a Sbit is seen even once during the acquisition period, the Sbit is set to 1 in the hitmap.
This new feature can be used to implement a new Sbit mapping check functionnality which can run quickly (less than 1 minute) and provide precious debugging information.
Types of issue
[ ] Bug report (report an issue with the code)
[x] Feature request (request for change which adds functionality)
Expected Behavior
Leverage the new firmware feature to provide precious Sbits debugging information.
The proposed local function/functor should have the following signature:
Brief summary of issue
The new OH firmware (3.2.6) adds a full-granularity binary Sbit accumulator. Said otherwise, if a Sbit is seen even once during the acquisition period, the Sbit is set to 1 in the hitmap.
This new feature can be used to implement a new Sbit mapping check functionnality which can run quickly (less than 1 minute) and provide precious debugging information.
Types of issue
Expected Behavior
Leverage the new firmware feature to provide precious Sbits debugging information.
The proposed local function/functor should have the following signature:
where the external vector is indexed by the pulsed/unmasked Sbit and the internal vector is the Sbit hitmap word is stored in little-endian.
performing the following:
Current Behavior
The Sbit hitmap is unused.
Context (for feature requests)
The Sbits mapping check currently takes a long time to run. We need a faster Sbit mapping check for debugging and possibly QC.
Moreover it can be the basis of the upcoming Sbits delay scan function.
Also, the Sbit monitor will sooner than later take into account the Sbit mapping while the hitmap will always follow the VFAT channels.
Your Environment