New Feature: added script for comparing sbit thresh measurements

[bdorney]

Description

Compares SBIT threshold measurements. Also can plot x-axis in terms of charge units instead of DAC units.

Help menu:

% plotSbitThreshComp.py -h
usage: plotSbitThreshComp.py [-h] [-a] [-c CALFILEARM] [-n] [-s] filename

Arguments to supply to plotSbitThreshComp.py

positional arguments:
  filename              To Be Filled In

optional arguments:
  -h, --help            show this help message and exit
  -a, --alphaLabels     Provide this argument if alphanumeric characters exist
                        in the third column of the input file
  -c CALFILEARM, --calFileARM CALFILEARM
                        File specifying CFG_THR_ARM_DAC calibration per vfat.
                        If provided x-axis of each VFAT will be converted from
                        DAC units to charge units (fC). Format of file follows
                        from TTree::ReadFile() with brnach names:
                        'vfatN/I:slope/F:intercept/F'
  -n, --noLeg           Do not draw a TLegend on the output plots
  -s, --savePlots       Make *.png file for all plots that will be saved in
                        the output TFile

Types of changes

• [ ] Bug fix (non-breaking change which fixes an issue)
• [X] New feature (non-breaking change which adds functionality)
• [ ] Breaking change (fix or feature that would cause existing functionality to change)

Motivation and Context

Needed a tool to easily compare SBIT Threshold Measurements.

How Has This Been Tested?

Example call:

plotSbitThreshComp.py -c $DATA_PATH/GE11-X-L-GHENT-0002/calFile_thrArmDAC_GE11-X-L-GHENT-0002.txt listOfScanDates_sbitThreshIterTrim_GE11-X-L-GHENT-0002.txt

Screenshots (if appropriate):

Note for above measurements VFAT22 was masked from the trigger.

Checklist:

• [x] My code follows the code style of this project.
• [x] My change requires a change to the documentation.
• [x] I have updated the documentation accordingly.
• [x] I have added tests to cover my changes.
• [x] All new and existing tests passed.

[bdorney]

Rebased off of HEAD of develop.