For simplicity assume I have products A, B and C with 1, 2 and 3 digital outputs each that I want to write a test for. Let's assume the test should have 1, 2 or 3 phases (with one measurement each) and a configurable name for each pin depending on the product.
What would be the canonical way of how to write such a generic test such that only some parametrization is needed for each product?
For simplicity assume I have products A, B and C with 1, 2 and 3 digital outputs each that I want to write a test for. Let's assume the test should have 1, 2 or 3 phases (with one measurement each) and a configurable name for each pin depending on the product.
What would be the canonical way of how to write such a generic test such that only some parametrization is needed for each product?