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hephy-dd / diode-measurement

IV/CV measurements for silicon sensors.
GNU General Public License v3.0
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current compliance only set on 2 SMUs when using 3 SMUs for biased FET measurements #80

Open thomasbergauer opened 1 year ago

thomasbergauer commented 1 year ago

When three SMUs are used in FET measurements (1 bias backplane, 1 source-drain, 1 gate), the current compliance entered in the software is only applied to two, but not on the third one (not sure exactly which is which).

arnobaer commented 1 year ago

Currently, there is no measurement supporting three voltage sources; only the measurement "IV Bias" supports a second SMU to control a bias voltage.

In case it is required, we could discuss how to create a new FET measurement that controls three independent sources.