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ivem-argonne / real-time-defect-analysis

FuncX-based service for performing real-time defect analysis of TEM micrographs
MIT License
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Add analysis of the voids to include whether they touch the side #16

Closed WardLT closed 9 months ago

WardLT commented 10 months ago

The segementation procedure should be able to tell if one of the pixels belonging to a void is touching (or, even, near) the edge. We should include whether that is the case within the features we use to describe a void.