ivem-argonne / real-time-defect-analysis

FuncX-based service for performing real-time defect analysis of TEM micrographs
MIT License
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Integration predictions from dislocation and void-labeling models #21

Open WardLT opened 4 months ago

WardLT commented 4 months ago

Create a single functions which combines the labels from multiple classification models. We will need some logic select a single label when models assign different labels for the same entity.