ivem-argonne / real-time-defect-analysis

FuncX-based service for performing real-time defect analysis of TEM micrographs
MIT License
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Handle Overlapping Instances in Defect Analysis #24

Open WardLT opened 3 months ago

WardLT commented 3 months ago

The defect analysis code was built originally for semantic segmentation models, which cannot have overlapping instances. We now use instance segmentation and need to relax that assumption.