`test_fifo` unit tests fail

[jmadden173]

Describe the Bug The unit tests on main do not currently plass

To Reproduce Steps to reproduce the behavior:

Run pio test -e test -f test_fifo from the main branch. Received output

test/test_fifo/test_fifo.c:283: test_FramPut_BufferFull [PASSED]
test/test_fifo/test_fifo.c:284: test_FramPut_Sequential [PASSED]
test/test_fifo/test_fifo.c:285: test_FramPut_Sequential_BufferFull      [PASSED]
test/test_fifo/test_fifo.c:286: test_FramGet_ValidData  [PASSED]
test/test_fifo/test_fifo.c:287: test_FramGet_BufferEmpty        [PASSED]
test/test_fifo/test_fifo.c:288: test_FramGet_Sequential [PASSED]
test/test_fifo/test_fifo.c:171: test_FramGet_Sequential_BufferFull: Element 1 Expected 204 Was 0        [FAILED]
test/test_fifo/test_fifo.c:238: test_FramBuffer_Wraparound: Expected 0 Was -3   [FAILED]

Expected Behavior Test should pass

Screenshots N/A

Environment

• OS: Linux spruce 6.8.2-arch2-1 #1 SMP PREEMPT_DYNAMIC Thu, 28 Mar 2024 17:06:35 +0000 x86_64 GNU/Linux
• Hardware version: 2.2.1
• Software version: 2.2.0
• Platformio Version: 6.1.15

Additional Context Could be an issue with either FramGet or FramPut. The error is reproducible on multiple boards.

[jmadden173]

The old (FM24CL16B) and new (MB85RC1MT) fram chip actually share the same I2C memory space and therefore cannot be solder on the board together. Need to double check the tested to verify this is the cause of the issue.

References: https://www.fujitsu.com/jp/group/fsl/en/imagesgig5/MB85RC1MT-DS501-00027-4v0-E.pdf https://www.infineon.com/dgdl/Infineon-FM24CL16B_16-Kbit_(2_K_8)_Serial_(I2C)_F-RAM-DataSheet-v13_00-EN.pdf?fileId=8ac78c8c7d0d8da4017d0ec99cb241e9