When simulating an entire microscope, we need to be able to trace an electron through multiple elements. The most obvious approach to achieve this would be to define a new SystemTracer which accepts multiple fields. Translation and rotations of the fields inside the 'global' coordinate system should be supported.
When simulating an entire microscope, we need to be able to trace an electron through multiple elements. The most obvious approach to achieve this would be to define a new
SystemTracer
which accepts multiple fields. Translation and rotations of the fields inside the 'global' coordinate system should be supported.