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m-mcgowan / spark-flashee-eeprom

Eeprom emulation using external flash on Particle devices. Includes unit tests cross compiled to regular gcc, and on-device integration tests.
GNU Affero General Public License v3.0
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stress tests #2

Closed m-mcgowan closed 10 years ago

m-mcgowan commented 10 years ago

When running on the device, a logical page can suddenly become erased after previously being written. I believe this is the problem that has been talked about on the forums with the flash memory sometimes not working due to conflicts on the SPI bus with the cc3000.

Some stress tests are needed to highlight this problem and test any proposed fixes.

m-mcgowan commented 10 years ago

I wrote stress tests as part of testing issue #3.