Write code to generate randoms corresponding to the HSC data products.
I think the right thing to do here is to:
For CCD/patch level tests, generate randoms on a per-CCD basis with the same WCS and number density as the data (times whatever random multiplier we want).
For visit-level tests, still generate the randoms on a CCD-level basis with the given WCS, but get the number density from the average number density of the whole visit or tract, plus Poisson noise. This way we don't have to try to reject chip gaps.
For tract-level tests...probably still generate on a patch-by-patch basis in case we don't include all the patches within the tract.
The last thing to be concerned about is rejection masks. Single pixels we don't worry about, but overlap regions for example we should. I'd rather not read in the masks if we don't have to but I'm not sure there's a better way to do it.
Write code to generate randoms corresponding to the HSC data products.
I think the right thing to do here is to:
The last thing to be concerned about is rejection masks. Single pixels we don't worry about, but overlap regions for example we should. I'd rather not read in the masks if we don't have to but I'm not sure there's a better way to do it.