Hard-code some parameters in the ECAT system tests to avoid calling Find Slave Path.vi which breaks deployment with latest drivers.
Update test 9401 DIO Scan Mode Loop Back.vi
Update test 9401 DIO FPGA Mode Loop Back.vi
Remove now unneeded sub VI Get UDV Section from System Definition.vi
Essentially, calling Find Slave Path.vi in both tests causes the deployment to fail. This works in older versions of the driver, and it works if you call the VI, close LabVIEW, then re-open and deploy. However, the same application instance shows the error every time.
(And yes, I could parameterize the new constants. However, I chose not to for now.)
Why should this Pull Request be merged?
Fix two tests that fail with driver versions 21.0+
What testing has been done?
Hand-copied the new files to the ATS and ran the tests successfully on an event where they previously failed.
What does this Pull Request accomplish?
Hard-code some parameters in the ECAT system tests to avoid calling
Find Slave Path.vi
which breaks deployment with latest drivers.test 9401 DIO Scan Mode Loop Back.vi
test 9401 DIO FPGA Mode Loop Back.vi
Get UDV Section from System Definition.vi
Essentially, calling
Find Slave Path.vi
in both tests causes the deployment to fail. This works in older versions of the driver, and it works if you call the VI, close LabVIEW, then re-open and deploy. However, the same application instance shows the error every time.(And yes, I could parameterize the new constants. However, I chose not to for now.)
Why should this Pull Request be merged?
Fix two tests that fail with driver versions 21.0+
What testing has been done?
Hand-copied the new files to the ATS and ran the tests successfully on an event where they previously failed.