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ni / semi-test-library-dotnet

Semiconductor Test Library
https://ni.github.io/semi-test-library-dotnet/
MIT License
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Fix Return Type of DMM Multipoint Extension Methods #130

Closed Mattjet27 closed 2 months ago

Mattjet27 commented 2 months ago

What does this Pull Request accomplish?

Fixes dmm multipoint extension methods by changing the return type to be PinSiteData<double[]>, instead of a 2D per-instrument, per-sample array double[][].

Why should this Pull Request be merged?

Note note that this is a breaking change. End user code should not use the incorrect method signature.

What testing has been done?

Added two new unit tests: ConfigureAndFetchMuliPoint_Succeeds & ConfigureAndReadMuliPoint_Succeeds