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ni / semi-test-library-dotnet

Semiconductor Test Library
https://ni.github.io/semi-test-library-dotnet/
MIT License
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Fix issue and optimize code to reduce test time #60

Closed lornazh closed 5 months ago

lornazh commented 5 months ago

What does this Pull Request accomplish?

  1. In Continuity Test, instead of caching/restoring source delay before and after forcing every time, do caching once at the beginning and restoring in the end.
  2. In Continuity/Leakage/FVMI/FIMV steps, wait for source complete event between source and measure to avoid DCPower 0x3FFA4001 warning (NIDCPOWER_WARN_MEASURE_WHILE_CHANGING_RANGE_CHECK_TRIGGER_CONFIGURATION).
  3. In DutPowerDown step, caching and restoring current limit when forceLowestCurrentLimitis enabled.
  4. Disable forceLowestCurrentLimitin the end of Continuity Test since it's not necessary between test steps.

Why should this Pull Request be merged?

The changes are to reduce test time and resolve unstable issues.

What testing has been done?

Manual test on ChiXiao.