Separate scan settings (profiles) from scan device, similar camera device/settings/module.

nion-software / nionswift-instrumentation-kit

Base classes for Nion Swift STEM microscope instrumentation

GNU General Public License v3.0

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Closed cmeyer closed 1 year ago

cmeyer commented 2 years ago

This may go along with:

cmeyer commented 1 year ago

Fixed 2ac48d1f9ea279af63884646edc7ec3c4a4fd701 and other commits.