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nion-software / nionswift-instrumentation-kit

Base classes for Nion Swift STEM microscope instrumentation
GNU General Public License v3.0
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Changing frame parameters in subscan mode makes scan forget its context scan #140

Closed Brow71189 closed 1 year ago

Brow71189 commented 1 year ago

This is annoying when preparing for SI, because you have to do one extra "Stop, Disable subscan, Scan, Stop, enable subscan" cycle before you can start your SI

cmeyer commented 1 year ago

If the FoV or context rotation changes while in the subscan, then the subscan representation on the context scan is no longer valid. Can you explain the specific workflow where this shows up as a problem?

Brow71189 commented 1 year ago

The specific workflow is that if you have subscan active and change the dwell time or number of pixels the context scan also gets invalidated. I understand that changing the FOV invalidates the context scan, but for the number of pixels or the dwell time it should stay valid while having subscan active, because it actually changes the number of pixels or the dwell time in the subscan from a user's perspective (probably changes to context in the background, but that is not obvious).