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nionswift-instrumentation-kit
Base classes for Nion Swift STEM microscope instrumentation
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secondary scan device
#149
Open
cmeyer
opened
1 year ago
cmeyer
commented
1 year ago
Fix issue where acquisition graphics would not appear on new channels. Test.
Fix more acquisition graphic edge cases: graphics only on enabled context displays. Test.
Add list listener utility and use to to handle onerous aspects of data channel.
Additional refactoring to limit use of data channels; also fix API view task with multiple channels.
Eliminate data channel methods from base hardware source. Minimize data channel use further.
Simplify handling of data channels updated. Eliminates more data_channels usage.
Eliminate summing-crop on EELS (now just summing). Remove obsolete tests.
Use stricter channel_id, no suffixes. Use variant as adjunct.
Rename 'channel_override' to 'channel_variant'. Eliminate data_channels accessor.
Separate data channel management to its own class DataChannelManager.
WIP: Begin isolating data channel class.
Several small refactorings to further isolate data channel.
Add mechanism to override channel mapping via scan module.
Improve handling of scan calibrations from device.
Remove spurious register_panel (prevented custom panels from working properly).
Add mechanism via DataChannelDelegate for scan modules to indicate viewable data channels.
Add a mechanism to prefer the primary scan_controller in the STEM controller.