test: Test IEEE754 comparison for Inf, NaN and Zeroes - Githubissues

okuoku / yuni

R7RS/R6RS/Generic Scheme portability platform

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test: Test IEEE754 comparison for Inf, NaN and Zeroes #157

Open okuoku opened 4 years ago

okuoku commented 4 years ago

ref: chibi-scheme issue 667

comparison test should cover: Flonum, Fixnum, Zeroes

Inf

Implementations must support both infinite objects (Plus and Minus)
+inf.0 > -inf.0

NaN

is an inexact number
in unordered for any given number arguments; any comparison, positive? and negative? must return #f if it included NaN as argument
(Yuni does not support rational nor complex numbers)

Zero

Plus zero and minus zero is optional; SIBR?
Plus Zero equals Minus Zero
(1.0 / +0) should be +inf.0 , (1.0 / -0) should be -inf.0

okuoku commented 3 years ago

xref: #163

okuoku commented 3 years ago

ref: https://github.com/shirok/Gauche/commit/9a9b6357141c8b2444538563cebfb3547add1688