It is currently possible to generate a depth-dependent absorption profile using the combined RT/TMM method, but this is not properly implemented for all methods. For some of the methods, this is because there is no physical meaning to an absorption profile (perfect mirror, perfect Lambertian scatterer, ray-tracing with Fresnel equations of an interface), but for RCWA and pure TMM interfaces this should work but doesn't.
It is currently possible to generate a depth-dependent absorption profile using the combined RT/TMM method, but this is not properly implemented for all methods. For some of the methods, this is because there is no physical meaning to an absorption profile (perfect mirror, perfect Lambertian scatterer, ray-tracing with Fresnel equations of an interface), but for RCWA and pure TMM interfaces this should work but doesn't.