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reflectivity / analysis

Data analysis for Neutron and X-ray Reflectometry
https://www.reflectometry.org/
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Identify ways to simplify modeling data from the same sample, with different techniques (e.g. reflectometry + fluorescence) #45

Open bmaranville opened 4 years ago

wpotrzebowski commented 3 years ago

@wpotrzebowski: to feedback from SAS community

bmaranville commented 3 years ago

From the last workshop: @arm61: a student is using a priori information from SANS and Brewster angle for inputs to reflectivity (follow-up?) A. Rennie: The only system commonly done is X-ray and neutron reflectivity, which often has issues with statistical weighting @andyfaff : ellipsometry is also used quite a bit. Polymer brushes, with varying thickness over the wafer, are fed in as a priori information for an incoherent addition model. @arm61 for X-rays, if doing GIXD simultaneous with reflectometry, could us results of GIXD to co-refine. @wpotrzebowski combining NMR with Bayesian statistical framework, there is a lot of activity in small-angle scattering world about combining X-ray with neutron measurements. @andyfaff: there is a desire for a general ellipsometry analysis package. There may be packages on github that have kernel.

andyfaff commented 3 years ago

My students (@igresh, @haydenrob) and I have been working on an ellipsometry aspect of this recently.