Is your feature request related to a problem? Please describe.
Very difficult to program new features to recalculate gate resistor etc. in every single exporter or every single self-written program
Describe the solution you'd like
Improvement for handling interpolating other data:
Pre-fill a multidimensional matrix for e_on/e_off/e_rr and channel-characteristics curves
This matrix will be interpolated once
This data can be more easily used to compare transistors
This data can be more easily used to make new calculations for usage in own programs
This data can be more easily used to export to other programs
Is your feature request related to a problem? Please describe. Very difficult to program new features to recalculate gate resistor etc. in every single exporter or every single self-written program
Describe the solution you'd like Improvement for handling interpolating other data: