Open csbell-vu opened 3 years ago
We can definitively test these issues; I'll run samples for all scenarios. I'll also look into the ways how the particle analyzer ID's particles –– does the machine assign the ID sequentially? If so, we can easily order the particles in the sequence in which they were measured.
Consider the following situation:
In this case, the classification may perform better since the model may be able to depend on the drift of one of the measured features. In this case, the microdebitage may have larger (or smaller) values based on systematic error from the measurement device.
To combat against this, some approaches are: