2020-iuc-sw-skku / LSC-Systems

산학협력프로젝트: 머신러닝 기반 Wafer Map Defect Pattern Identification
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Model Evaluation for Each Class #15

Closed dotoleeoak closed 4 years ago

dotoleeoak commented 4 years ago

predict.py를 모델 평가로 수정함 아직 평가되는 값은 기본 값만 있어서 더 필요하면 말하슈

illuminoplanet commented 4 years ago

No Look Merge