2020-iuc-sw-skku / LSC-Systems

산학협력프로젝트: 머신러닝 기반 Wafer Map Defect Pattern Identification
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cnn ensemble-learning machine-learning smart-factory wafer-map

산학협력프로젝트 - LSC 시스템즈

2020년도 성균관대학교 산학협력프로젝트, 2020.04 ~ 2020.12
Machine learning-based anomaly detection for smart factory


📚 Description

추가 문서화 예정


🔨 Guideline

git을 설치한 후, clone 명령어를 이용해 해당 repository를 받으세요.

git clone https://github.com/2020-iuc-sw-skku/LSC-Systems

clone이 끝나면, data 폴더에 LSWMD.pkl을 받아주세요.

내용 추가 예정


👍 Contributors


📘 Reference

WM-811K(LSWMD)

Paper

[0] A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing
[1] Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets
[3] Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis
[4] Wafer defect patterns recognition based on OPTICS and multi-label classification
[5] Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features
[6] Research on Image-Based Automatic Wafer Surface Defect Detection Algorithm