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2020-iuc-sw-skku / LSC-Systems

산학협력프로젝트: 머신러닝 기반 Wafer Map Defect Pattern Identification
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추가 feature 성능 #26

Closed ssupecial closed 4 years ago

ssupecial commented 4 years ago

https://docs.google.com/document/d/1e1dUvvw-citOTHflUmE03n6qlnWWEStIxQzJx79q4to/edit?usp=sharing