cococastano / PythonDryEtchModel

Python tool for modeling silicon etch profile from the dry plasma etching tool in the SNF
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PythonDryEtchingTool

Code was developed for SNF at Stanford University in conjunction with the E241 course. These scripts are meant to predict etch profiles from dry silicon etching based on know etch rates. Three versions are provided (version 2 is the most up-to-date):

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Environment

Python 3.6 was used for developing these scripts. My personal preference is using Spyder IDE in the Anaconda environment. The solvers rely heavily on some imported python packages, so you environment should have the following installed: openCV (cv2), shapely, and pyvista. I encourage you to familiarize yourself with documentation and install instructions for each package, but in particular pyvista has a number of dependencies, most notably vtk, and some others, for full functionality, include: imageio, appdirs, and meshio.

All these packages can be directly installed from the command line (i.e., Anaconda command line) with pip. For example:

pip install vtk
pip install opencv-python

numpy >= 1.19.2 pyvista >= 0.27.4 matplotlib >= 3.3.4 cv2 >= 4.4.0 scipy >= 1.5.2 shapely >= 1.6.4

Process Flow

Most input expected from the user is specified in the top sections of the code. Most notably the path to a etch mask is required. This is a binary .png file (example shown below).

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Here is will describe the Version 1 code as it is meant to replace Version 0. After the mask is provided, tune the desired etch rates in the vertical and horizontal directions, the curved profile of the isotropic etch will be interpolated. Other parameters can be set, like time step (t_step) or resoltuion of mesh (set_res) that affect solution time.

Future of the Code

I am not a coder, so my code is messy. I would be happy for a savy coder to come along and clean up this work and maybe create more elegant classes. For SNF users, eventually I want there to be enough data that this tool can take in recipe settings (i.e. gas composition and bias voltage) and interpolate horizontal and vertical etch rates.

Contact:

ncastano@stanford.edu