luttero / maud

Materials Analysis Using Diffraction
BSD 3-Clause "New" or "Revised" License
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MAUD is an open source software developed mainly at the University of Trento by Luca Lutterotti to analyse samples using the so-called combined analysis. The combined analysis takes inspiration from the Rietveld method (that is included) to extend it to other type of analyses by diffraction and spectroscopic techniques. At the moment this includes Diffraction, Reflectivity, X-ray fluorescence as techniques and MAUD can obtain information on the crystal structure, microstructure, crystallographic texture, residual stresses, macro stresses, phase quantities and chemical composition. MAUD is written in Java and is available for the 3 main platforms: Windows, MacOS and LinuX.

See the LICENSE file for the license.